Certainty factor and dempster-shafer method analysis for early detection of final year student depression

Open

R.D. Sari, R. Rahmadani, T.T.A. Putri, H.D. Hutahaean, S. Sriadhi

2020 IOP Conference Series: Materials Science and Engineering Vol. 830 Issue 3 Conference paper Cited by 3 SDG 3SDG 4 Quartile

Abstract

Academic loads in writing a thesis cause difficulties to students to complete their studies. This problem can be solved with the application of an expert system with early detection of depressive final-year students that compares Certainty Factor method and Dempster-Shafer method. Certainty Factor method used to measure facts certainty or rules in defining the level of expert confidence, while the Dempster-Shafer method combines uncertainty that has characteristics according to the way of thinking of experts but has a mathematical basis. The purpose of comparing these methods is to get the most appropriate and best method for early detection of depression. The methodology used in this study is a comparative test between two methods, with a mechanism (1) Collecting data related to the depression of final year students; (2) Data acquisition and weighting of confidence values; (3) Calculate formulations from both methods; (4) Perform a comparative test to obtain conclusions. Certainty Factor method is the most appropriate and the best model in early detection of depression, because Certainty Factor method revealed that the more symptoms are given, the higher the probability of detection of depression. © Published under licence by IOP Publishing Ltd.

Affiliations

PTIK-FT, Universitas Negeri Medan, Indonesia

Research at a Glance

Premium content — register to unlock

Research at a Glance

Register to unlock

Topics & SDG Alignment

Premium content — register to unlock

Topics & SDG Alignment

Register to unlock

Collaboration

Premium content — register to unlock

Collaboration

Register to unlock

Author Profile (Selected)

Premium content — register to unlock

Author Profile (Selected)

Register to unlock

References Overview

Premium content — register to unlock

References Overview

Register to unlock

Journal & Source

Premium content — register to unlock

Journal & Source

Register to unlock

Metadata & Integrity

Premium content — register to unlock

Metadata & Integrity

Register to unlock